XRF Instruments - MasterXRF

The Standard of Accuracy

The MasterXRF^® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money.  

The instrument allows for the continuous, fully automatic monitoring of metal concentration in plating baths such as alkaline or acidic  ZnNi , Cr and Co passivation solutions , as well as elemental Cr, Fe ,Ni, Cu, Zn, Pd, Ag, Sn and Au.  Up to four separate plating lines can be measured sequentially with the option to set up individual measurement programs for each line. The solution can be pumped directly from the plating tank that connects to the instrument’s measurement tubing. This unique design eliminates the need for a specific solution  measuring cell or a manifold assembly requiring flushing or cleaning of the solution lines. Operation of the instrument is through an easy-to-use touch screen user interface and nearly maintenance free. Quantification is accomplished utilizing a state-of-the-art fundamental parameter (FP) software.

Software Features:

• Summary - Shows element concentrations for 4 plating lines on one screen.
• Measure - Shows measurement of a selected plating line.
• Chart - Shows charts for all enabled plating lines.
• Table - Shows tabular data of a selected plating line.
• Pump - Schedule sample pumps off and on time.
• Limits - Set concentration high and low limits. Dosing pumps turn on at low limit and off at high limit.
• Control - Implements proportional and derivative feedback control. Supports cathode basket control.
• Relay - Displays relay on/off charts for relays in the  Limits and Control tabs.
• Program - Program automatic line sampling order and duration using simple script commands.
• Calibrate - Calibrate the instrument for accurate measurement.
• Service - Displays tabs for less used functions. Allows port naming and application selection.
• Spectrum - Shows the spectrum for the last measurement or for any selected measurement.